Researchers from the labs of Professors Vinayak Dravid and Omar Farha developed a high-resolution approach to map ...

Researchers at the California NanoSystems Institute at UCLA published a step-by-step framework for determining the ...

The subatomic world is hard to image not just because it’s incredibly tiny, but super fast too. Now physicists at the University of Arizona have developed the world’s fastest electron microscope to ...

Photonic chip used in this study, mounted on a transmission electron microscope sample holder and packaged with optical fibers. Credit: Yang et al. DOI: 10.1126/science.adk2489 Photonic chip used in ...

In this interview, AZoMaterials speaks with Professor Sarah Haigh, Professor of Materials Characterization at the University of Manchester, about her pioneering work in electron microscopy and its ...

A team of researchers at the University of Victoria (UVic) have achieved an advance in electron microscopy that will allow scientists to visualize atomic-scale structures with unprecedented clarity ...

Today we are machining some metal inside the scanning electron microscope! By creating a custom fixture, we can manually ...

Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...

Behold, the world’s fastest microscope: it works at such an astounding speed that it’s the first-ever device capable of capturing a clear image of moving electrons. This is a potentially ...

They can image a wide range of materials and biological samples with high magnification, resolution, and depth of field, thereby revealing surface structure and chemical composition. Industries like ...

It’s a problem that few of us will ever face, but if you ever have to calibrate your scanning electron microscope, you’ll need a resolution target with a high contrast under an electron beam. This ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.